ytsp-128ebc array eddy current board

powerful array eddy current capability
equipped with high-performance array eddy current technology, it supports synchronous detection of up to 128 channels.
the detection efficiency is greatly improved compared with traditional equipment,
far exceeding the conventional industry standard.
built-in c-scan imaging function visually presents defect profiles and enables precise defect positioning,
effectively avoiding missed detection and false detection.
it flexibly adapts to a variety of inspection scenarios,
perfectly balancing large-area rapid scanning and accurate identification of tiny defects,
and meets diverse application demands in industrial inspection, scientific research and other fields.
mea series probe
it features excellent compatibility and is applicable to all probe types, including flexible, super-flexible,
semi-rigid, pen-type, point-type and tangential probes.
it also supports customized probe development to meet the demands of special inspection scenarios.
it supports signal processing under multiple inspection modes. gain and filter parameters can be flexibly adjusted to optimize the display effect of inspection images and further enhance defect recognition capability.
dedicated supporting software
the software is easy to operate with powerful functions. it supports preset probe parameters and customized array layout, enables fast calibration procedures, and greatly reduces the difficulty of manual operation.
it is compatible with point-type, array, special-shaped and other various probes without replacing any hardware.
it flexibly adapts to different inspection requirements and effectively cuts down equipment operation and maintenance costs.
modular integrated design
adopting a modular board design, it can be flexibly embedded into various equipment systems. featuring stable operation and high compatibility, it effectively reduces costs for equipment development and system integration.
basic specifications
receiving gain: automatic adjustment